Application of Cellular Automata for Very Large Scale Integration Test

Investigates the implementation scheme of cellular automata(CA) for application in the pseudo-random test of very large scale integration(VLSI) as a test pattern generator.The CA structure is synthesized based on the original polynomial expression synthesized from another shift inequitable sequence,which is built by sampling the sequence generated by linear feedback shifter register(LFSR),and the isomorphic theory of CA and LFSR,then determine the initial state of CA by fast logic simulation.The method can shorten the length of CA,shorten the test time and obtain a higher fault coverage.