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Broadband InSe/MoS2 Type-II Heterojunction Photodetector with Gate-Tunable Polarity Induced Near-Linear Wavelength-Dependent Photocurrent Peak

  • Wenying Zhang
  • , Kuan Hao Chiao
  • , Hsin Wen Huang
  • , Mohamed Abid
  • , Cormac Ó Coileáin
  • , Kuan Ming Hung
  • , Ching Ray Chang
  • , Yuh Renn Wu*
  • , Han Chun Wu*
  • *此作品的通讯作者
  • Beijing Institute of Technology
  • National Taiwan University
  • Universität der Bundeswehr München
  • National Kaohsiung University of Science and Technology
  • Chung Yuan Christian University

科研成果: 期刊稿件 › 文章 › 同行评审

摘要

Selectable polarity in van der Waals materials not only broadens the scope of design for electronic components but also opens new avenues for the development of advanced electronic, optoelectronic, and sensor devices. In this study, we fabricated vertically stacked InSe/MoS2 van der Waals type-II heterojunction photodetectors and conducted a systematic investigation of their photoelectrical properties. Our findings demonstrate the high performance of these photodetectors, characterized by effective suppression of charge recombination, the presence of both positive and negative photoconductivity under different incident light excitations, broad-spectrum detection ranging from 400 to 1064 nm, and remarkable responsivity and photodetectivity values of 10,200 A/W (−1430 A/W) and 3 × 1013 cm Hz-1/2 W-1 (3.6 × 1011 cm Hz-1/2 W-1) at 532 nm (1064 nm), respectively. Additionally, the fabricated photodetectors exhibit a gate-tunable polarity transition at a gate voltage of −20 V, leading to a photocurrent peak, the position of which shows a near-linear dependence on the incident light wavelength. By applying external gate voltages, the van der Waals heterojunctions can flexibly switch between functions such as photodetection, modulation, and storage in different applications, providing new scope for the design of integrated circuits and the development of multifunctional devices. Through Poisson and drift-diffusion simulations, we attribute the observed negative photoresponse to electrons excited from the InSe valence band to the MoS2 conduction band and subsequently trapped at the interface. The photocurrent peak arises from charge carrier accumulation at the interface, with its position determined by the interplay between the hole accumulation density in InSe and electron accumulation density in MoS2. Our results present a promising opportunity for the design of compact spectrometers based on van der Waals type-II heterojunction photodetectors.

源语言英语
页(从-至)12941-12951
页数11
期刊ACS Applied Materials and Interfaces
卷17
期8
DOI
出版状态已出版 - 26 2月 2025

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